Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...
insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
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