Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

CRT test pattern generator built on M5StickC PLUS2 outputs PAL/NTSC composite patterns, making quick on-site CRT checks easy ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Eight New Models Offer Biggest Display Size, Deepest Memory and the Only Pattern Generation Available in a Fixed Configuration PALO ALTO, Calif.—Agilent Technologies Inc. expands its industry-leading ...