The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...
Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology. (Nanowerk News) Materials scientists at the ...
The highlight of this work lies in successfully combining the advantages of both approaches: through a simply optimized inverse-temperature crystallization method, single-crystal-like films are ...
Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...
This study constitutes a demonstration of highly textured, large-area perovskite photodiodes integrated sturdily onto FTO substrates and paves. CHENGDU, SICHUAN ...
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